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Humboldt-Universität zu Berlin - Faculty of Mathematics and Natural Sciences - Strukturforschung / Elektronenmikroskopie

Humboldt-Universität zu Berlin | Faculty of Mathematics and Natural Sciences | Department of Physics | Strukturforschung / Elektronenmikroskopie | Publications | AlGaN multilayer examined by low‐loss EELS and relativistic Kramers‐Kronig analysis

Alberto Eljarrat and Christoph T Koch (2018)

AlGaN multilayer examined by low‐loss EELS and relativistic Kramers‐Kronig analysis

In: Proceedings of the International Microscopy Congress 19 in Sydney, Australia, Sydney.