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Humboldt-Universität zu Berlin - Faculty of Mathematics and Natural Sciences - Strukturforschung / Elektronenmikroskopie

Humboldt-Universität zu Berlin | Faculty of Mathematics and Natural Sciences | Department of Physics | Strukturforschung / Elektronenmikroskopie | Publications | Defect distribution and compositional inhomogeneities in Al0.5Ga0.5N layers grown on stepped surfaces

A Mogilatenko, A Knauer, U Zeimer, and M Weyers (2016)

Defect distribution and compositional inhomogeneities in Al0.5Ga0.5N layers grown on stepped surfaces

Semiconductor Science and Technology, 31(2):025007.